Product category:
Memory Devices and Modules
News Release from: Ramtron International
Edited by the Electronicstalk Editorial
Team on 15 September 2006
Automotive-qualified FRAMs on show in
Detroit
Ramtron International Corp is to exhibit at Convergence 2006, where it will preview its line of FRAM devices to be qualified for AEC Q100.
Ramtron International Corp has announced plans to exhibit at Convergence 2006 (Booth 201) from 16th to 18th October in Detroit, USA, where it will preview its line of FRAM devices to be qualified for AEC Q100 Ramtron is currently growing a broad line of FRAM nonvolatile memory devices for demanding automotive applications
This article was originally published on Electronicstalk on 4 Jul 2002 at 8.00am (UK)
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The company is aggressively pursuing plans to qualify its FRAM parts to AEC Q100 (Automotive Electronic Council's Stress Test Qualification for Integrated Circuits) standards, and is developing a number of FRAM configurations specified for the Grade 1 (-40 to +125C) operating range.
This qualification programme has been developed to support a number of specific customer design-ins that are already in place.
"We are committed to meeting the design and sourcing challenges in the automotive industry with this line of AEC Q100-qualified FRAM parts", said Ramtron Vice President Mike Alwais.
"No other nonvolatile memory solution can match FRAM's fast write speed and high endurance".
"These latest developments are taking FRAM beyond in-cab applications into the vehicle's most stringent environments".
The AEC Q100 qualification programme comes in tandem with the growing need for better nonvolatile data storage solutions in automotive subsystems.
Electronic content in vehicles is becoming "smarter" with the use of microcontrollers and sensors; FRAM already plays a vital role in high-content applications such as intelligent airbags, occupant sensors, infotainment systems, antipinch/trap sunroofs, automatic transmission, adaptive cruise control, steer-by-wire, etc because it offers what older memories like EEPROM and Flash cannot: fast writes, high endurance and low power consumption.
Fast writes are beneficial when capturing data from sensors, especially in noisy automotive environments or when power may suddenly fail.
High endurance enables designers to capture information as often as they wish without the risk of wearing out the memory.
Low power is an added benefit in applications with ever-lower power budgets such as car entertainment systems.
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