Seminar explains reliability enhancement testing

Bob Page of Reliability Plus and Martin Shaw from Reliability Solutions will host a seminar on reliability enhancement testing at Tin Technology near St Albans on 7th and 8th March.

In response to continuing demand, Bob Page of Reliability Plus and Martin Shaw from Reliability Solutions, two independent experts in their fields, are presenting the next reliability enhancement testing seminar at Tin Technology, Frogmore, near St Albans on 7th and 8th March 2006.

Ever growing competition from around the world means reliability enhancement is now a necessity rather than an option; companies can save time and reduce costs while increasing profitability.

This intensive two-day foundation course has been pitched at a level that will appeal to all electrical/electronic design, production, quality engineers and managers.

delegates will gain a thorough introduction to reliability enhancement testing based on accelerated stress screening methods (HALT/HASS) and analytical and statistical techniques for predicting product life and MTBF.

The seminar focuses on practical implementation and features real-life case studies, including reliability issues relating to lead-free manufacturing processes (RoHS Directive 2002/95/EC, deadline 1st July 2006).

Valuable open forum workshops are included, with time available for networking and individual one-to-one discussions.

There is also an opportunity to tour Tin Technology's extensive test and analysis laboratories.

Copresenter Martin Shaw commented how pleased he was with the positive feedback from previous seminar delegates.

Comments included: "Well constructed and informative", "There are hundreds who could benefit from this excellent course" and "I learned how to use the results from reliability testing to calculate the expected product life".

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