Product category:
Exhibitions, Courses, Conferences and Training
News Release from: Reliability Plus
Edited by the Electronicstalk Editorial
Team on 06 November 2006
Reliability enhancement techniques
explained
Intensive two-day reliability enhancement foundation course is pitched at a level that will appeal to all electrical/electronic design, production, quality engineers and managers.
Responsing to continuing demand, Bob Page of Reliability Plus and Martin Shaw from Reliability Solutions, two independent experts in their fields, are presenting in association with Systegration, the next Reliability Enhancement Testing seminar at Tin Technology, Frogmore near St Albans on 14th and 15th November 2006 Ever growing competition from around the world means reliability enhancement is now a necessity rather than an option; companies can save time and reduce costs while increasing profitability
This article was originally published on Electronicstalk on 8 Nov 2004 at 8.00am (UK)
Related stories
Engineers and technicians must be trained
Leading UK engineering and technology firms, with a combined multi-million pound spend on training and development, will assemble at the IEE 'Investing in Technical Teams' forum on 4 November 2004.
Workshop gives complete picture on CE.NET 5.0
A UK-based workshop will give embedded software development engineers hands-on experience in running the new 5.0 release of Windows CE.NET on next generation processors.
This intensive two-day foundation course has been pitched at a level that will appeal to all electrical/electronic design, production, quality engineers and managers.
delegates will gain a thorough introduction to reliability enhancement testing based on accelerated stress screening methods (HALT/HASS) and analytical and statistical techniques for predicting product life and MTBF.
The seminar focuses on practical implementation and features real-life case studies, including reliability issues relating to lead-free manufacturing processes (RoHS Directive 2002/95/EC, 1st July 2006).
Valuable open forum workshops are included, with time available for networking and individual one-to-one discussions.
There is also an opportunity to tour Tin Technology's extensive test and analysis laboratories.
Copresenter Martin Shaw commented how pleased he was with the positive feedback from previous seminar delegates, who said the seminar: "was well constructed and informative", "confirmed suspicions that our present test regime may not be properly targeted or applied in the correct way", and "taught how to use the results from reliability testing to calculate the expected product life".
• Reliability Plus: contact details and other news
• Email this article to a colleague
• Register for the free Electronicstalk email newsletter
• Electronicstalk Home Page
Search the Pro-Talk network of sites
