Product category:
Compliance Engineering
News Release from: Rohde and Schwarz | Subject: ZVA-K7
Edited by the Electronicstalk Editorial
Team on 04 December 2006
Network analyser takes on pulsed
measurements
Rohde and Schwarz has expanded its high-end R and S ZVA network analyser with a software option for pulsed measurements.
Rohde and Schwarz has expanded its high-end R and S ZVA network analyser with a software option for pulsed measurements The R and S ZVA-K7 enables pulse profile measurements on semiconductor components and antenna/radar systems
This article was originally published on Electronicstalk on 8 Sep 2004 at 8.00am (UK)
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Absolute levels, complex S parameters and quantities derived from it can be displayed in real time by using pulses with a resolution of 12.5ns.
In addition, the option allows the analysis of periodic and single pulses.
Special advantage of the new method is the simple test setup, allowing measurement settings within seconds.
Whether in mobile radio or radar systems, amplifiers and antenna systems often have to cope with pulsed signals in real operation.
On-wafer measurements require pulsed signals in order to avoid overheating.
With the R and S ZVA-K7 option, Rohde and Schwarz has integrated pulsed measurements into the R and S ZVA high-end network analyser family, thus providing a compact and cost-efficient solution.
No additional hardware components are required for analysing pulsed signals.
The pulsed RF signal is generated by an external signal source such as the R and S SMR or it is generated by modulating the R and S ZVA generator with an external pulse modulator.
The Rohde and Schwarz concept is based on directly recording the signal with a sampling rate of 80MHz.
Dynamic range and system error correction are thus independent of the duty cycle.
Pre- and post-trigger settings enable the user to position the measurement window relative to the pulse signal and to selectively measure pulse intervals such as the increase of the signal edges.
The delays between measurement and reference signal can be easily compensated: precise ratio measurements can still be performed even if the delays are larger than the pulsewidth.
The new option allows measurements on pulses with a minimum width of 50ns.
The measurement bandwidth can be set to a maximum of 30MHz and allows measurements of pulse rise times of 33ns.
The resolution for pulse profile measurements is 12.5ns.
Because of the large memory depth, the user can continuously record pulse profiles of up to 3ms.
The R and S ZVA-K7 option is now available from Rohde and Schwarz.
Depending on the test setup, the R and S ZVA-B16 hardware option is recommended in order to ensure direct generator and receiver access. Request a free brochure from Rohde and Schwarz ...
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