Product category:
ATE Systems
News Release from: Rohde and Schwarz | Subject: R and S CompactTSVP production test platform
Edited by the Electronicstalk Editorial
Team on 31 August 2007
Platform allows fast digital testing
The R and S TS-PHDT high-speed digital test module features a maximum data rate of 40MHz and a storage capacity of 1.5Gbyte.
The PXI-based R and S CompactTSVP production test platform from Rohde and Schwarz can now be equipped with a new option that enables fast digital functional testing even in applications where large amounts of data have to be handled The R and S TS-PHDT high-speed digital test module features a maximum data rate of 40MHz and a storage capacity of 1.5Gbyte
This article was originally published on Electronicstalk on 8 Sep 2004 at 8.00am (UK)
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All stimulus, nominal and actual data required for testing electronic assemblies is stored locally.
Due to the real-time comparison of actual and nominal data, the recorded test data no longer has to be transferred to the system controller, considerably reducing test time.
Rohde and Schwarz developed the compact R and S TS PHDT test module in close co-operation with the RF and Automotive Business Unit of Atmel.
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The new option was designed for the higher requirements in digital functional testing that are due to the trend toward using ever more complex digital circuits on electronic assemblies.
The T and M equipment must also satisfy these requirements with regard to memory depth, real-time analysis capability, and level programming.
The R and S TS PHDT is the first PXI-based solution available on the market for these applications.
During the initialisation of a functional test, the stimulus data and the nominal data of the DUT is transferred in a single step to the local 1.5 Gbyte memory (3 x 64 Msamples) of the test module.
Afterwards, all test cases are immediately available without any further time for loading being required.
The integrated analysis hardware compares nominal data with recorded actual data in real time and documents the deviations.
The pass/fail information provides an immediate overview of erroneous test steps and indicates, for example, the number of errors or the failed channels without transferring the test data to the system controller.
In addition, the module enables users to program nonvolatile memories in microcontrollers and flash components as well as simulating digital control or processor buses.
The module takes up only one slot of the R and S CompactTSVP platform.
Operation is via a soft panel and a driver in dll format.
The module is controlled via the PCI bus of the test platform.
The PXI trigger functionality makes it possible to synchronise the module with further R and S TS-PHDT modules as well as with other Rohde and Schwarz or PXI-based measurement and stimulus modules.
The number of digital channels required for additional tests on analogue and digital signals can be easily expanded. Request a free brochure from Rohde and Schwarz ...
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