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Seica
Address:
Via Kennedy 24
Strambino
Turin
10019
Italy
Telephone: (Italy) +39 0125 6368 11
http://www.seica.com
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Listing of all 9 news releases from Seica:
Flying-probe tester tackles boards from both sides
The Pilot V8 has 14 mobile resources fully available to test the UUT, with a full range of in-circuit and functional test capabilities.
News from Seica (31 March 2008)
ATE advances aid production automation
At Nepcon in Birmingham Seica will showcase several new products within its Viva Integrated Platform that aim to meet the challenges of today's focus on automation.
News from Seica (23 April 2007)
Test systems to support Rafale fighters
Seica and EADS Test and Services have received a contract from Dassault Aviation to provide test systems for the production testing of onboard electronics of Rafale fighters.
News from Seica (13 March 2007)
System speeds PCB test throughput
Flying probe test system addresses demand for cost-effective test solutions that will further enhance ease of programming, high fault coverage and fast throughput for PCB test.
News from Seica (13 November 2006)
Hauptmann manages Central Europe
Bernd Hauptmann has assumed the position of Seica Sales Manager for Central Europe, based in Munich.
News from Seica (27 October 2006)
Expansion set to double tester output
With the completion of a brand new 1300m2 production hall, Seica has nearly doubled its production capacity.
News from Seica (19 July 2006)
ATE systems promise maximum flexibility
Seica, Italy's electronics test OEM, has added several new products within its new Viva integrated platform.
News from Seica (15 November 2005)
EADS signs for modular test unit
Seica has signed a licensing agreement with EADS Test and Services to add a third level optional testing capability to its line of second level systems, Atec Series 6 and derived products.
News from Seica ( 3 March 2005)
Test platform covers full product lifecycle
A new integrated test platform from Seica includes cutting-edge technology to implement the multiple test strategies needed to address the challenges of electronic testing.
News from Seica (28 February 2005)
