http://www.electronicstalk.com/news/sij/sij000.html Silicon Metrics news releases on Electronicstalk en-gb Copyright (C)2008 Pro-Talk Ltd. All rights reserved. Sat, 22 Nov 2008 08:00:00 UT Sat, 22 Nov 2008 08:00:00 UT http://www.pro-talk.com/images/protalklogo90.gif http://www.pro-talk.com/ 90 79 New from Silicon Metrics, SiliconSmart SI provides cell characterisation and modelling of signal integrity (SI), a critical requirement for complex SoC designs at 130nm and below. Fri, 07 Mar 2003 08:00:00 UT Silicon Metrics http://www.electronicstalk.com/news/sij/sij103.html Fairchild Semiconductor has selected SiliconSmart CR for characterisation and modelling of both internal and third-party standard cell libraries used by its design organisations. Tue, 13 Aug 2002 08:00:00 UT Silicon Metrics http://www.electronicstalk.com/news/sij/sij102.html SiliconSmart IO is the industry's first commercial toolset designed to perform detailed characterisation, modelling and electrical specification compliance verification. Wed, 07 Aug 2002 08:00:00 UT Silicon Metrics http://www.electronicstalk.com/news/sij/sij101.html Silicon Metrics has released multi-operating-point Synopsys Liberty Scalable Polynomial Delay Models (SPDMs) through its characterisation and modelling tools. Thu, 18 Oct 2001 08:00:00 UT Silicon Metrics http://www.electronicstalk.com/news/sij/sij100.html