Product category:
Power Supply ICs and Controllers
News Release from: International Rectifier | Subject: Rad-hard solid state relays
Edited by the Electronicstalk Editorial
Team on 29 April 2005
Rad-hard solid state relays boost
reliability
International Rectifier has launched a quartet of devices in a new line of rad-hard solid state relays (SSRs) for high reliability (hi-rel) applications.
International Rectifier has launched a quartet of devices in a new line of rad-hard solid state relays (SSRs) for high reliability (hi-rel) applications The new hermetically sealed SSRs are radiation-hardened all-electronic devices designed to improve reliability by replacing electromechanical relays in power bus switching, heater control circuits, battery charging and other hi-rel applications
This article was originally published on Electronicstalk on 15 Feb 2001 at 8.00am (UK)
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The first SSR is the RDHA710SE10A2Q (SMD mount) dual SSR, with current handling capabilities of 20A (10A when properly derated) and a breakdown voltage capability of 100V, which is high enough to allow normally applied derating.
The second and third devices are the RDHA701FP10A8Q and the RDHA701FP10A8C, containing eight SPST, NO, 1.5A, 100V SSRs with selectable input actuation methods and a choice of rise/fall time control.
They are housed in 64-pin surface mount packages.
The fourth SSR is the RDHA720SF06A1N, a single 20A, 60V device, also in an SMD package.
The new devices are characterised for total dose levels of up to 100krad (Si) or higher, and single event effects (SEE) immunity up to an linear energy transfer (LET) of 37MeV/(mg.cm2) or higher.
Isolation is 1000V I/O Class "P" (unscreened): "H" and "K" screening is also available.
The new SSRs are available in single, dual or octal SPST NO (single pole, single throw, normally open) type with current ratings of 1.5A to 20A at 60 to 100V.
Most of these devices are available in alternative style packages for flange mounting.
In addition, some of the new relays have internal circuitry to control output transition times for lower dV/dt and dI/dt, minimising system RFI/EMI, an important feature in today's compact systems.
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