Visit the National Instruments web site

Staccato specifies Teradyne flex test platform

A Staccato Communications product story
Edited by the Electronicstalk editorial team Dec 13, 2006

Teradyne and Staccato Communications have jointly announced that the Flex Test Platform has been specified for the production ramp of Staccato's Ripcord product family based on Certified Wireless USB.

Teradyne and Staccato Communications have jointly announced that the Flex Test Platform has been specified for the production ramp of Staccato's Ripcord product family based on Certified Wireless USB.

Staccato and Teradyne will work together in creating low cost test solutions for Staccato's single-chip, all-CMOS devices.

Using Teradyne's advanced multi-site test capability will strengthen Staccato's ability to ship the most aggressively priced high-volume Certified Wireless USB products.

"With the final stages of worldwide regulatory approval and logo certification imminent, we are preparing a steep production ramp of Certified Wireless USB based silicon".

"Our choice of the Flex Platform for ATE and our collaboration with Teradyne enables the most efficient path for volume production," said Ken Molitor, vice president of operations for Staccato Communications.

"We selected Teradyne's factory-supported Flex Test Platform systems because they are widely deployed, highly scalable, and their multisite test capability ensures fast manufacturing test times resulting in lowest test costs of our Ripcord single-chip, all-CMOS product family".

Staccato offers the Ripcord family of products, the industry's only single-chip, all-CMOS solution based on the WiMedia Alliance's UWB common radio platform and Certified Wireless USB by the USB Implementers Forum.

The Ripcord 3500P series is implemented using leading 110nm digital CMOS process technology and offered in a variety of packaging options including a complete System-in-Package (SiP).

"Teradyne's goal is to enable efficiencies in test that result in the lowest cost and highest throughput to meet the needs of Staccato's aggressive production ramp".

"Staccato is well positioned in the market with an advanced product roadmap that extends to next-generation dual-band silicon that maintains low cost, small form-factor and low power consumption products for Certified Wireless USB and Bluetooth 3.0," said David Trounson, general manager, Semiconductor Test Wireless Business Unit, Teradyne.

"By joining 'Team Staccato,' Teradyne reinforces our commitment to the growing industry of Certified Wireless USB and WiMedia UWB".

Teradyne's Flex Test Platform, which just surpassed its 1000th unit shipment, advances test technologies in an architecture designed for high-efficiency, multisite test.

A broad range of single-board, high-performance, high-density analog (AC and DC) and digital instruments replicate the device-operating environment for test and lets users apply the best test strategy for high-performance digital or high-precision analog at package or probe.

Teradyne's Gen4 Microwave instrument covers the broadest range of RF semiconductor test applications in the marketplace and can be configured from 4 to 38 RF ports with a full range of scalar and vector source and measurement capabilities.

Users also have the ability to perform functional test via modulated signal generation and analysis functionality for mainstream wireless protocol standards.

Teradyne is a leading supplier of Automatic Test Equipment used to test complex electronics used in the consumer electronics, automotive, computing, telecommunications, and aerospace and defence industries.

In 2005, Teradyne had sales of USD1.08 billion, and currently employs about 4000 people worldwide.

Not what you're looking for? Search the site.

Back to top Back to top

Contact Staccato Communications

Related Stories

Contact Staccato Communications

 

Newsletter sign up

Request your free weekly copy of the Electronicstalk email newsletter ...

Visit the National Instruments web site

Search by company

A Pro-talk Publication

A Pro-talk publication