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Product category: Design and Development Software
News Release from: SynTest Technologies | Subject: DFT-PRO 100 and 200 Series
Edited by the Electronicstalk Editorial Team on 27 October 2004

ATPG starter packages improve ASIC
quality

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The DFT-PRO 100 and 200 Series of automatic test program generator starter packages include the essential design-for-test tools for comprehensive ASIC testing.

Design-for-test (DFT) leader SynTest Technologies is now offering DFT-PRO 100 and 200 Series of ATPG starter packages that include the essential DFT tools for comprehensive ASIC testing These tools will be able to operate on scan-inserted netlists and will include tools for testing DFT rules' violations, automatic test pattern generation (ATPG), as well as test pattern formatting to directly link to ATE from popular vendors such as Advantest, Agilent, Credence and Teradyne

Experience has shown that to ensure a high quality of complex ASICs with respect to manufacturing faults and to shorten test development time, DFT methodology must be employed into ASIC designs.

Today, to curb costs, more and more large and small semiconductor companies are shifting the DFT insertion responsibility from dedicated DFT engineers to ASIC design engineers.

Further, they are also increasingly out-sourcing the design activity to independent ASIC design houses.

In case of ASIC design engineers, more than one engineer now needs to access the DFT tools at the same time.

In case of ASIC design houses, usually strapped for cash, they now have to handle multiple projects simultaneously.

In either case, the engineers cannot wait for tool licences to become available.

Consequently, they are all looking for unhindered accessibility to DFT tools for multiple users, and needless to say, with easy affordability.

"To facilitate inclusion of DFT at the design stage itself, without having to unduly burden financial resources, we are now offering the DFT-PRO 100 series of DFT tool packages", remarked L-T Wang, President and CEO of SynTest Technologies.

He added: "With the affordable cost of these starter tool packages, our customers would be in a great position to recover their investment in the tools in a very short time, in many cases with their first design".

"Currently, we are offering two versions of the DFT-PRO 100 series".

"The DFT-PRO 100 is a basic package, while the DFT-PRO 200 is a package for chips with higher performance and shrinking geometries", said Ravi Apte, VP of Strategy and Business Development at SynTest.

"We do not want availability of the DFT tools to become a bottle-neck for these design engineers or design houses, and are hence offering multiple licence options at affordable prices".

"We expect this affordable pricing would also help designers of IPs to verify their fault coverage at the design stage itself".

The DFT-PRO 100 package contains the following tools: TurboCheck-Gate - for DFT testability analysis at gate level; TurboScan-ATPG - for automatic test pattern generation for stuck-at, n-detect (multiple-detect), and Iddq fault models; and TesterOut - a formatter to output test vector sets in formats that directly link to ATE from Advantest, Agilent, Credence, and Teradyne.

The DFT-PRO 200 package is the basic DFT-PRO 100 package with additional support for transition and bridging fault models.

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