Product category:
Design and Development Software
News Release from: Synopsys | Subject: TetraMAX and Odyssey
Edited by the Electronicstalk Editorial
Team on 25 October 2006
Links accelerate IC yield ramp
Links between TetraMAX automatic test pattern generation diagnostics and the Odyssey yield management system accelerate yield ramp at foundries.
Synopsys has created links between its TetraMAX automatic test pattern generation (ATPG) diagnostics and its Odyssey yield management system (YMS) for accelerating yield ramp at foundries These links will enable high-throughput export of test failure diagnostics generated by the TetraMAX tool into the Odyssey YMS
This article was originally published on Electronicstalk on 19 Apr 2001 at 8.00am (UK)
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Foundries will benefit from this ability to analyse vast amounts of diagnostics data generated from volume production runs (a capability often referred to as "volume diagnostics") to steadily improve process yield.
Their fabless clientele will also benefit through earlier access to high-yielding nanometre processes, and through faster ramp-to-volume of individual products.
"Synopsys considers high-throughput linkage between failure diagnosis data and yield management systems a critical step toward the realisation of full-volume diagnostics for production runs", noted Dr J Tracy Weed, Director of the Manufacturing Enabling Products Group at Synopsys.
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"The link between TetraMAX diagnostics and Odyssey YMS will benefit both foundries and fabless companies by accelerating yield ramp of their high-volume production ICs".
Faster yield ramp depends on the ability to gather cumulative failure statistics across wafer lots and take corrective actions.
The TetraMAX diagnostics quickly and accurately identify logic in a design that could contribute to observed mismatches in the ATPG pattern set.
The Odyssey YMS cross-correlates data sets, exploiting data mining capabilities to identify underlying physical mechanisms for yield loss.
However, collecting diagnostics information for all failing devices in a high-volume production run and building a database to analyse and correlate the failure data has traditionally been a manually-intensive and time-consuming process.
The TetraMAX-Odyssey link is designed to streamline yield management of production ICs by facilitating real-time collection and analysis of high-volume failure data extracted from multiple die and wafer lots.
"For years, the TetraMAX solution has provided designers the ability to quickly and accurately diagnose parts with scan test failures", said Graham Etchells, Director of Test Marketing, Synopsys Implementation Group.
"Now we are seeing the TetraMAX solution deployed at leading foundries worldwide as an essential ingredient of their yield learning platforms for nanometre processes".
"The TetraMAX-Odyssey link is a key enabling technology that will increase the effectiveness of volume diagnostics and streamline the use model".
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