Product category:
Design and Development Software
News Release from: Synopsys
Edited by the Electronicstalk Editorial
Team on 08 February 2007
Williams honoured for lifetime
achievement
Dr Thomas W Williams will receive the European Design and Automation Association Lifetime Achievement Award at the 2007 DATE Conference.
Synopsys Fellow Dr Thomas W Williams is to be honoured with the European Design and Automation Association (EDAA) Lifetime Achievement Award at the plenary session of the 2007 DATE Conference on 17th April 2007 in Nice, France The Lifetime Achievement Award is given to individuals who have made outstanding contributions to the state of the art in electronic design, automation and testing of electronic systems during their life
This article was originally published on Electronicstalk on 19 Apr 2001 at 8.00am (UK)
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In order to be eligible, candidates must have made innovative contributions that had an impact on the way electronic systems are being designed.
In addition to his work at Synopsys, Dr Williams is an Adjunct Professor at the University of Calgary, Alberta, Canada.
Prior to joining Synopsys in 1998, Dr Williams was Manager of the VLSI Design for Testability Group at the IBM Microelectronics Division in Boulder, colourado.
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He received a bachelor's degree in electrical engineering from Clarkson University, a master's degree in pure mathematics from the State University of New York at Binghamton, and a PhD in electrical engineering from colourado State University.
"Tom's contributions to the IC test industry are many and far-reaching, and this industry recognition is well deserved", said Dr Antun Domic, Senior Vice President and General Manager of Synopsys' Implementation Group.
"Many of the test procedures used today are based on Tom's pioneering work in full-scan test technology".
"We congratulate him on receiving this honour and acknowledge the great contributions he has made to both Synopsys and the industry in advancing test technology".
"As he continues to be as active as ever, we look forward to many more innovations from Tom in the coming years".
In 1989, Dr Williams and Dr EB Eichelberger shared the IEEE Computer Society W Wallace McDowell Award for Outstanding Contribution to the Computer Art, and was cited "for developing the level-sensitive scan (LSSD) technique of testing solid-state logic circuits and for leading, defining, and promoting design for testability concepts".
Since then, Dr Williams has had a significant influence on the IC design community adopting full scan as a de facto standard.
As a result of his efforts, the EDA industry has been able to base many of its leading tools on the foundation of the full-scan design structure, including mainstream logic synthesis, static timing analysis and formal verification solutions.
Dr Williams was a founding member of the IEEE Test Technology Committee and was named an IEEE Fellow in 1988.
He started the first workshop of the IEEE Test Technology Technical Committee - the DFT Workshop also known as the "Vail Workshop" - the first test workshop of any kind in 1978.
He also cofounded the first Test Workshop in Europe - the European DFT Workshop.
This later grew into the European Test Conference and then into a significant portion of DATE.
Dr Williams has authored a number of seminal papers in support of the adoption and enhancement of scan techniques, including the first LSSD (with EB Eichelberger) paper.
He has received a number of best paper awards, including the 1987 Outstanding Paper Award from the IEEE International Test Conference for his work in the area of VLSI self-testing (with W Daehn, M Gruetzner and CW Starke), a 1987 Outstanding Paper Award from the CompEuro 87 for his work on self-test, a 1989 Outstanding Paper Award (Honourable Mention) from the IEEE International Test Conference for his work on AC test Quality (with U Park and MR Mercer), and a 1991 Outstanding Paper Award from the ACM/IEEE Design Automation Conference for his work in the area of synthesis and testing (with B Underwood and MR Mercer).
He also has 20 patents and has authored or edited four books on testing and design for testability.
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