Product category:
Design and Development Software
News Release from: Synopsys | Subject: Device-parameter measurement in Hercules PVS
Edited by the Electronicstalk Editorial
Team on 16 March 2007
Device paramater measurement added to
Hercules PVS
Advanced device-parameter measurement added to the Hercules Physical Verification Suite (PVS) to correlate device behaviour to IBM 65nm semiconductor process.
Synopsys has announced the availability of advanced device-parameter measurement capability in its Hercules Physical Verification Suite (PVS) Developed to support the latest release of 65nm design kits from IBM, this new capability enables IBM foundry customers using the Hercules layout versus schematic (LVS) rule files in the kit to easily and accurately correlate device behaviour to the IBM process
This article was originally published on Electronicstalk on 19 Apr 2001 at 8.00am (UK)
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These IBM foundry customers also have access to the latest Hercules design rule checking (DRC) as part of the 65nm design kit release.
These files are qualified for accuracy and optimised for performance.
"We have been supporting Synopsys Hercules PVS for over a decade", says Dave Harame, Director of Enablement, IBM Global Engineering Solutions.
"Synopsys has consistently proven its ability to meet our needs and those of our foundry customers as we transition to more advanced technology nodes".
As device geometries continue to shrink to 65nm and smaller, circuit performance is improved by changing transistor behaviour through the application of special process layers.
However, the presence of these layers increases the complexity of measuring device parameters such as speed, power and area during physical verification due to the number of complex calculations involved.
IBM and Synopsys have collaborated to deliver the algorithms necessary to support these new requirements.
This entailed adding more device measurement commands to Hercules PVS.
These new Hercules commands, which are fed into IBM's proprietary calculations, deliver greater accuracy so customers can better understand design performance at 65nm.
"Emerging technology nodes require ongoing innovation for products like Hercules PVS to accurately represent device behaviour to the design community", says Anantha Sethuraman, Vice President of Marketing, Design for Manufacturing, at Synopsys.
"Our collaboration with IBM, a longtime Synopsys customer and partner for verification, has yielded an important capability -- a silicon-correlated solution -- for our mutual customers".
The new capability for Hercules PVS is available now.
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