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Product category: ATE Systems
News Release from: Teradyne
Edited by the Electronicstalk Editorial Team on 14 May 2001

Silicon Vision comes to Teradyne for
sensor tester

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Silicon Vision has purchased a Teradyne IP750 image sensor test system for multisite testing of CCD and CMOS image sensor devices.

Silicon Vision has purchased a Teradyne IP750 image sensor test system for multisite testing of CCD and CMOS image sensor devices The IP750, which is based on the popular Integra J750, has been designed and developed by Teradyne's Japan Division

The IP750 has the 100MHz digital tester functionalities, and the state-of-art hardware and software architecture that answer the needs for testing CCD/CMOS image sensor devices, which requires complex functional testing.

The IP750 image sensor test system incorporates the Windows NT based IG-XL software as the test development environment which allows users for quick test program development and maintenance.

Furthermore, the IP750 features the novel integrated parallel (IP) architecture, where complete parallel processing features are built in several different architecture levels, in both hardware and software.

The IP architecture includes the DSP functions of image data, which run on the PC under multiprocessor, multithreaded program execution environment.

Silicon Vision has selected Teradyne's IP750 test system for engineering, and as its production test solution.

Marcus Verhoeven, Manager Test and Quality Control, at Silicon Vision AG said, "The IP750's broad range of image sensor instruments delivers us the most advanced technology for characterizing our new device designs, and its high-parallel test capabilities provide us the lowest cost of test.

The IP750's single platform architecture for engineering and production, together with Teradyne's high level of experience, enables us to accelerate the time to market of our products.

We appreciate Teradyne's understanding and superior support of our growing business requirements".

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