Product category:
ATE Systems
News Release from: Teradyne
Edited by the Electronicstalk Editorial
Team on 10 January 2002
Casey takes over assembly test at
Teradyne
John M Casey has been named President of the Teradyne Assembly Test Division, replacing Robert Dutkowsky who left the company.
John M Casey has been named President of the Teradyne Assembly Test Division, replacing Robert Dutkowsky who left the company Casey joined Teradyne's sales organisation in 1977 from the printed circuit board test industry
After several years in sales management positions, he was appointed Vice President of Worldwide Sales for the Semiconductor Test Group in 1990.
In 1994, he moved to the Telecommunications Division in Deerfield IL and in 1995 became the General Manager of that division.
He later served as the General Manager of the company's digital integrated circuit test activities in Agoura Hills CA.
Most recently, he has been the Vice President of Worldwide Field Operations for the Semiconductor Test Division.
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