Product category:
Stand-Alone Instruments
News Release from: Tektronix | Subject: TDS8200/82A04
Edited by the Electronicstalk Editorial
Team on 13 July 2004
Sampling oscilloscope breaks measurement
barriers
The TDS8200 modular sampling oscilloscope and 82A04 phase reference module combine to enable design engineers to characterise and validate performance of leading-edge products.
The TDS8200 modular sampling oscilloscope and 82A04 phase reference module combine to enable design engineers to characterise and validate performance of leading-edge products The new oscilloscope can be configured to provide bandwidth to 70GHz, and is the only single-ended and differential clock recovery system covering all current and emerging serial data standards between 50Mbit/s and 12.6Gbit/s
This article was originally published on Electronicstalk on 19 Aug 2008 at 8.00am (UK)
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The TDS8200 offers an industry-best system jitter of less than 200fs (RMS) at these datarates.
The TDS8200 enables designs with tighter tolerances to be achieved, thus reducing costs and increasing component performance.
Characterising serial data signals with embedded clocks has historically been a significant challenge.
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Electrical signal standards such as XAUI at 3.125Gbit/s and 2x XAUI at 6.25Gbit/s require instruments that can acquire these complex signals at ultrafast datarates and that can be used for precise characterisation.
Designs with limited jitter budgets and tight timing margins require the test equipment with the best signal fidelity and ability to provide accurate and repeatable results.
To handle differential signals, test equipment must be flexible enough to provide true differential acquisition and clock recovery across multiple datarates.
The new TDS8200 sampling oscilloscope meets these needs.
"Digital designers are continually pushing the limits of test and measurement equipment", said John Taggart, General Manager, Electro Optical Products, Tektronix.
"The introduction of the TDS8200 and 82A04 gives unparalleled flexibility and a significant leap forward for the acquisition and characterisation of serial data signals from 2 to 12.5Gbit/s".
"For the fastest and most demanding applications, customers can obtain the most accurate test results using the TDS8200 Series measurement system".
The TDS8200 improves on earlier models by providing system jitter of less than 200fs (RMS).
This improved measurement system fidelity can eliminate false test failures and enables more accurate characterisation of design tolerances, resulting in increased component performance and reduced costs.
The TDS8200 acquires data up to 25 times faster than competing solutions while measuring in low-jitter timebase phase reference mode.
Using FrameScan, an acquisition mode exclusive to Tektronix, the TDS8200 also provides the ability to measure random and deterministic jitter.
With these new oscilloscope features, engineers are better able to perform accurate, repeatable compliance testing of high-speed, low-power differential signals with the capability to trigger on embedded clocks, facilitating the creation of new leading-edge products.
"As the speed of our designs increases, the eye closure associated with the 1ps (RMS) system jitter of instruments currently in the market is becoming a significant issue", comments William George, Senior Vice President Operations and Chief Manufacturing Office at ON Semiconductor.
"The TDS8200 with the 82A04 phase reference module is the only measurement system that provides us less than 200fs (RMS) system jitter and adequate bandwidth to accurately characterise our new 6Gbit/s designs".
"This capability enables us to stay ahead of competitors and bring products to market faster".
"The TDS8200 is the 'golden reference' for testing emerging serial data standards".
With the 80A05 electrical clock recovery module, the TSD8200 also provides the only differential clock recovery solution for all current and emerging serial data standards from 50Mbit/s to 12.6Gbit/s.
It is also the industry's only clock recovery solution for differential and single-ended signals from 3 to 6Gbit/s.
Emerging standards in this space include XAUI, 2x XAUI and SATA2.
When combined with the 80E0x electrical signal acquisition module, the measurement system provides a complete electrical signal analysis and clock-recovery solution for differential and single-ended signals.
In addition to standard rate support, users can specify custom bitrates in order to test devices, modules and systems running at emerging or nonstandard rates, enabling users to work within data ranges.
The wide clock-recovery range and support for user-specified bitrates - all in a single module - provides a complete clock-recovery solution for testing of a wide range of computer and communications signalling rates and standards. Request a free brochure from Tektronix ...
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