Product category:
Stand-Alone Instruments
News Release from: Tektronix | Subject: DDR2/DDR3 test tools
Edited by the Electronicstalk Editorial
Team on 07 May 2008
Memory testers are ready for DDR3
Tektronix now offers a complete test bench for the latest generations of double-datarate memory devices.
Tektronix has come up with a complete test toolset for DDR2 and new DDR3 technology DDR3 is the next generation of double datarate (DDR) synchronous dynamic random access memory (SDRAM) that will deliver higher performance datarates
This article was originally published on Electronicstalk on 17 Jan 2001 at 8.00am (UK)
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The Tektronix DDR test solution supports all speeds of DDR, DDR2 and DDR3, spans both analogue and digital domains, and is based on industry-leading hardware and software.
Tektronix offers the engineering customer a complete DDR3 test bench.
The DDR3 standard supports datarates of 800 to 1600 million transfers per second with clock frequencies of 400 to 800MHz, respectively - double the speed of DDR2 technology.
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DDR3 should be ideal for high-performance applications such as file servers, video on demand, encoding and decoding, gaming and 3D visualisation.
For digital validation and debug, the TLA7000 logic analyser and the new TLA7BB4 acquisition module provide the only logic analysis solution available to address all speeds of DDR, DDR2 and DDR3, including DDR3-1600.
Furthermore, this new DDR test set provides a cost savings up to 30% over existing approaches.
The TLA7BB4 with Nexus Technology DDR3/DDR2 Protocol Violation Software automates the analysis of a DDR2 or DDR3 bus to quickly and easily identify protocol violations, frequency of those violations, and also provide a global view of all the DDR commands in the logic analyser memory.
With memory support and probing solutions, the TLA7000 series provides the most capable solution for digital validation and debug.
Physical link analysis is performed using a DSA8200 sampling oscilloscope for TDR-based signal path characterisation and circuit board verification.
For analogue validation and debug, the new DDR Analysis option (opt DDRA) on the DSA70000 family of digital serial analysers along with matching P7500 TriMode active differential probes and DPOJET measurement software, provide a powerful debug toolset that automatically identifies reads and writes, and performs clock, jitter, amplitude, timing, and eye diagram measurements.
New DDR probe tips for the P7500 Series are able to attach to hard to reach portions of the device under test.
According to Chris Martinez, Director of Strategic Marketing, Tektronix: "Leading edge designs, short product lifecycles, increasing design complexity, and measurement conformance for specific technologies and datarates necessitates superior validation and test tools".
"With leading oscilloscopes, logic analysers, probes and supporting software, engineers have access to an entirely new portfolio with the industry-best capabilities needed to develop next generation products incorporating DDR technology".
"The portfolio of high-speed test products from Tektronix provides engineers with the latest and most advanced tools available and forms the core of a critical test bench for design and test engineers working with DDR".
Components of the DDR test suite are available for purchase and delivery from Tektronix.
Additional elements for logic analyser memory support including DDR3/DDR2 protocol violation software are available for purchase from Nexus Technology. Request a free brochure from Tektronix ...
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