Webcast to examine amplifier noise

Design engineers can register now on the TI website for a live webcast entitled "Amplifier noise: types, origins, magnitude predictions and reduction techniques".

Design engineers can register now on the TI website for a live Analog eLab webcast entitled "Amplifier noise: types, origins, magnitude predictions and reduction techniques".

Presented by Texas Instruments and Memec Insight, the webcast will air at 1700 GMT on Wednesday 9th March 2005.

This session, hosted by TI analogue expert Bill Klein, PE, will provide design engineers with an online lab environment for a discussion on theory and demonstrations at the lab bench.

Klein's guests for this webcast are Neil Albaugh, Senior Applications Engineer at TI and Dan Ngai, Technical Business Manager at Memec Insight.

The free, hour-long session will explore the origin and random nature of various noise signatures generated by electronic circuits.

As the probability of the occurrence of noise varies depending on the type of noise, Klein and Albaugh will explain the different variations, their characteristics, and the statistics behind them.

During the lab segment, they will demonstrate a new tool that is used to predict the noise from operational amplifier circuits.

Tests will be performed to determine which techniques improve the noise performance of amplifier circuits.

Klein and Albaugh will also include a demonstration of the noise signatures and the results of reduction techniques.

A special Q and A segment will follow the discussion and lab demonstrations.

Viewers are welcome to e-mail their questions to Klein and Albaugh for on-air ideas and recommendations.

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