Development board aids ADC evaluation

A new tool aims to save design time and development cost in high-speed applications, allowing fast digital data capture from TI's high-speed high-resolution A/D convertors.

Texas Instruments has developed a new tool to save design time and development cost in high-speed applications, allowing for fast digital data capture from its high-speed high-resolution A/D convertors.

The new data capture card and software allow the user to easily evaluate ADC performance and quickly select the best device for their application in systems such as 2.5G/3G wireless basestations, communications and test and measurement equipment.

The TSW1100 features data capture speeds of up to 170Msample/s, resolution up to 16bit and data capture depths of up to 1 million points.

It can operate in single-channel or dual-channel mode, allowing synchronous capture of a dual-channel ADC.

Data are transferred via Universal Serial Bus (USB) interface, allowing easy control from a personal computer, and it requires only one wall-mounted power supply for operation.

In the past, analysing ADC performance often required investing in a costly logic analyser and performing complex analysis routines.

For select high performance TI ADCs, the TSW1100 makes those steps unnecessary, providing accurate data with its embedded logic analyser mode.

With the accompanying software, users quickly compute ADC performance metrics such as signal-to-noise ratio (SNR) and spurious free dynamic range (SFDR).

The software also allows the user to save the raw data set or performance graphs for future analysis.

The TSW1100 is available today from TI and its authorised distributors.

The price of $499 includes the data capture board, software, power supply and USB cable.

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