Product category:
ATE Systems
News Release from: Vectron | Subject: K2-AOI
Edited by the Electronicstalk Editorial
Team on 30 May 2003
Second magazine award for inspection
system
The Vectron K2-AOI automated optical inspection system has received the 2003 EP and P Global Excellence Award for Inspection.
The Vectron K2-AOI automated optical inspection system has received the 2003 EP and P Global Excellence Award for Inspection Vectron has also recently received the 2003 Best In Test award from Test and Measurement World Magazine
This article was originally published on Electronicstalk on 8 Nov 2004 at 8.00am (UK)
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The EP and P Excellence Awards were established in 1989 to recognise the most innovative products in the electronics manufacturing industry.
Entries are accepted in five different categories and a panel of industry experts evaluates each nominated product based on direct benefit to the user, innovation in design/development, uniqueness, cost effectiveness and quality enhancement.
A winning product is chosen from finalists in each category and the single product with the highest overall score receives the EP and P Excellence Award Vectron offers large-format digital-colour automated optical inspection (AOI) systems featuring parametric measurement technology.
Vectron's technology results in much greater speed, accuracy, and reliability than possible with conventional AOI systems, enabling manufacturers to maximise their first-pass yields and increase their profitability.
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