Signal-conditioning devices tested for integrity

Edited by the Electronicstalk editorial team Apr 8, 2008

Test system provides low cost of test and supports a full range of digital, mixed-signal, RF and wireless applications.

ZMD has standardised on the V93000 SOC Series for wafer sort and final test of its high-end, mission-critical signal-conditioning devices.

ZMD is a leading global supplier of analogue and mixed-signal solutions for automotive, industrial, medical, and consumer applications.

ZMD has added incremental V93000 capacity to its test floor for dedicated, highly parallel wafer sort - testing 16 devices simultaneously.

The unique parallel test capability of the V93000 optimises ZMD's cost of test.

"We have been using the V93000 for four years now, and as a result of that experience, we have tremendous confidence in Verigy solutions as well as in Verigy support", says Ralf Petzoldt, Test Manager at ZMD.

"The V93000 is the only tester available that addresses our cost-of-test needs with parallel test at wafer sort".

"In reference to the International Technology Roadmap for Semiconductors (ITRS), we achieve a mixed-signal wafer multi-site efficiency of 91% with the V93000".

"Quality and reliability are of paramount importance in the medical and automotive environments where mission-critical devices such as sensor signal conditioners are widely used", says Pascal Ronde, Vice President of Sales, Service and Support, Verigy.

"The V93000 offers the specific capabilities that ZMD needs to confirm all of the required safety metrics for its devices".

"In addition, massively parallel test is required not only for the cost sensitivity of these markets but also to ensure ZMD's long-term return on investment in semiconductor test".

"The V93000 delivers on all scores".

The Verigy V93000 provides a scalable platform architecture for testing SoCs, systems-in-package (SIPs) and high-speed memory devices.

The V93000, with more than 1500 RF-ready systems installed worldwide, meets the industry's demanding performance and cost challenges, whether for at-speed engineering characterisation or high-volume production.

The test system provides low cost of test with massive multi-site capabilities, with datarates up to 12.8Gbit/s and supports a full range of digital, mixed-signal, RF and wireless applications, such as cellular, WLAN, WiMAX and UWB.