Product category:
Intellectual Property Cores
News Release from: Virage Logic | Subject: STAR Memory System
Edited by the Electronicstalk Editorial
Team on 20 February 2004
Memory system boosts automotive camera
reliability
The reality of cars that warn drivers of road hazards and track potentially dangerous behaviour of other nearby cars is closer than you think, thanks to MobilEye Vision Technologies.
The reality of cars that warn drivers of road hazards and track potentially dangerous behaviour of other nearby cars is closer than you think, thanks to MobilEye Vision Technologies (Jerusalem, Israel), maker of a single camera driving assistance SoC called EyeQ, and in part to Virage Logic Corp, whose semiconductor IP is being used in the innovative system MobilEye has licensed the Virage Logic Self-Test and Repair (STAR) Memory System that is used in the MobilEye EyeQ
This article was originally published on Electronicstalk on 4 Mar 2003 at 8.00am (UK)
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Agere Systems has adopted Virage Logic's Self-Test and Repair (STAR) Memory System.
The MobilEye EyeQ offers a solution for computationally intensive real-time visual recognition and scene interpretation.
The chip architecture is designed to maximise cost performance by performing a full-fledged image application, such as a low-cost adaptive cruise control, using a single video source on a single, ultra-low-cost chip.
The system can be used in a variety of automotive applications, including on side mirrors to alert the driver of cars coming from behind, inside the car to control the release of air bags based on passenger size, in adaptive cruise control, in forward collision warning, rain sensing, tunnel sensing, and much more.
Further reading
Embedded memory system addresses nanometre issues
A leading provider of semiconductor IP platforms and pioneer in self-test and self-repair embedded memories, Virage Logic Corp.
Memory system IP proves popular
The Silicon Aware Self-Test and Repair (STAR) Memory System has exceeded 100,000,000 units shipped.
Logic libraries cut silicon costs
Long known in the embedded memory market, Virage Logic is extending its role to the broader category of semiconductor IP platforms with its first foray into logic components.
The technology has been adopted by a majority of the world's leading automotive manufacturers and suppliers in Japan, Europe and the USA, and MobilEye has a number of strategic production agreements with manufacturers and suppliers worldwide.
The STAR Memory System, which self-tests and repairs embedded memories, enables MobilEye and its customers to reduce manufacturing costs and deliver higher product reliability, both of which are important in automotive applications.
Because Virage Logic has built test and repair intelligence into the STAR Memory System, it eliminates the need for expensive external testers or laser repair equipment thereby resulting in a drastic reduction in test development time and cost.
In addition, whenever the MobilEye camera is powered on, the STAR Memory System performs a self-test and repairs the faulty devices to boost the system reliability.
"We chose Virage Logic's STAR Memory System because of its unparalleled quality and reliability, which are essential in automotive applications", said Ziv Aviram, President and CEO of MobilEye.
"The STAR Memory System also enables very high yield for our very high volume product.
In addition, Virage Logic provided us with excellent local support in Europe and in Israel, where our R and D facilities are located".
"MobilEye's EyeQ is extraordinary technology and we are very pleased our STAR Memory System is playing an enabling role in such an exciting product", said Jim Ensell, Vice President of Marketing for Virage Logic.
"Our commitment to quality and superior customer support makes the fit between Virage Logic and MobilEye especially good, given the nature of the applications in which EyeQ is used".
The STAR Memory System provides cost effective embedding, on-chip testing, and repairing of designs incorporating multiple megabits of memories.
The system can test Area, Speed and Power (ASAP) and STAR memories and repair STAR memories.
In addition to the memories, the system consists of a STAR Processor that is the test and repair engine and a STAR Fuse Box that stores the repair information.
The system substantially reduces test costs and improves overall yield, potentially saving millions of dollars in recovered silicon and achieving a shorter time to volume.
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