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Tester checks Edge transmitter alignment

Edited by the Electronicstalk editorial team Jun 2, 2004

Willtek has boosted its ability to test Edge-capable mobile devices by launching the 4468 Edge System Option for its Willtek 4400 Series mobile phone tester.

Willtek has boosted its ability to test Edge-capable mobile devices by launching the 4468 Edge System Option for its Willtek 4400 Series mobile phone tester.

The new testing option will allow production and service centres to test and align the transmitters of new Edge-capable mobile devices such as mobile phones and data cards.

These new measurements are specifically important for the alignment of these latest devices, for example after component exchange.

The 4400 with the Edge System Option provides low test cost per mobile device for manufacturers and service centres.

First customer shipments will be in July.

Willtek's 4400 Series mobile phone tester already has Edge testing capabilities and its modulation spectrum measurements are being used by manufacturers to align the phone's transmitter.

The new system option now offers extended capabilities including the attach/detach process, and power and modulation quality measurements of 8-PSK signals.

These are especially important as the transmitters of Edge-enabled devices must support the more stringent modulation used by Edge.

This requires individual testing and alignment in manufacturing and after repair, in particular for the Edge power amplifier within the device.

Edge transmitter alignment is due whenever a component in this circuit has been replaced.

The alignment is typically run as part of the repair job; service centres also perform a final test to ensure the quality of the device before shipping it to the customer.

Willtek engineers are currently working to add Edge testing capabilities to their automated Rapid! test programs, which are being used for final test and incoming inspection.

The 4468 Edge System Option supports the new power-time template and modulation measurements for Edge, such as error vector magnitude, IQ origin offset and frequency error.

Measurements are supported both in call and non-call mode; call mode testing includes call processing and is used in incoming and outgoing inspections while manufacturers require the non-call mode for the alignment.