Product category:
Design and Development Hardware
News Release from: XJTAG | Subject: XJTAG development system
Edited by the Electronicstalk Editorial
Team on 22 May 2007
System evolves to monitor FPGA
developments
Development system offers easy access to FPGA analogue debug and system management tool for thermal management and measurement of on-chip power supply voltages.
XJTAG has enhanced its development system by adding support for Xilinx's recently announced new feature, the Virtex-5 FPGA System Monitor This will provide XJTAG users with easy access to what is the industry's first FPGA analogue debug and system management tool for thermal management and measurement of on-chip power supply voltages
This article was originally published on Electronicstalk on 20 Feb 2006 at 8.00am (UK)
Related stories
Boundary scan pinpoints faults on complex PCBs
Briton EMS, a UK based contract electronics manufacturer, has selected the XJTAG development system as its boundary scan test solution.
Boundary scan speeds reference design to market
TTPCom has selected the XJTAG development system as its boundary scan test solution.
"These new features complement our already extensive debug and test capabilities by allowing customers to check power supplies or perform overall thermal management using the JTAG port on the 65nm Virtex-5 FPGAs", says Dominic Plunkett, Chief Technology Officer at XJTAG.
The Xilinx System Monitor is built around a fully specified 10bit 200Ksample/s general-purpose ADC.
Automatic calibration and self check features ensure accurate and reliable measurements over a temperature range of -40 to +125C.
Further reading
Boundary scan answers CEM test demands
UK based contract electronics manufacturer Barric has selected XJTAG as its boundary scan test solution partner.
Development system suits EMS demands
SMS Electronics has bolstered its already extensive test capability with the addition of the XJTAG boundary scan development system.
The System Monitor is now fully integrated within the XJTAG environment providing users with easy to access on-chip power supply monitoring, temperature monitoring, and precision analogue inputs.
"Many of our customers use the JTAG chain at the prototyping stage to very rapidly debug highly complex, densely populated printed circuit boards containing multiple BGA/FPGA devices", adds Plunkett.
"Now, with these new Xilinx features, they can simultaneously monitor the FPGA power supplies and other analogue inputs to assess if they are performing within the required tolerances".
"Also, the thermal performance of the FPGA can be measured".
The XJTAG development system is a cost-effective "out-of-the-box" solution for debugging, testing and servicing electronic printed circuits boards and systems throughout the product lifecycle.
The XJTAG system reduces the time and cost of board development and prototyping by allowing early test development, early design validation of CAD netlists, fast generation of highly functional tests and test re-use across circuits using the same devices.
XJTAG enables engineers to test a high proportion of the circuit (both boundary scan and cluster devices) including ball grid array (BGA) and chip scale packages, such as SDRAMs, Ethernet controllers, video interfaces, Flash memories, field programmable gate arrays (FPGAs) and microprocessors.
XJTAG also enables in-system programming of FPGAs, complex programmable logic devices (CPLDs) and Flash memories.
Pricing for the XJTAG system ranges from GBP 3500 (Eur 5075) to GBP 9900 (Eur 14,355).
• XJTAG: contact details and other news
• Email this article to a colleague
• Register for the free Electronicstalk email newsletter
• Electronicstalk Home Page
Search the Pro-Talk network of sites
