Product category:
Design and Development Software
News Release from: XJTAG | Subject: Boundary scan development system
Edited by the Electronicstalk Editorial
Team on 04 June 2007
Development system debugs precision
motion
Etel uses the XJTAG boundary scan development system to debug and test complex printed circuit boards used in its market-leading range of advanced digital motion controllers.
Etel, a leading global supplier of direct drive motion control components and integrated systems, has selected the XJTAG boundary scan development system to debug and test complex printed circuit boards used in its market-leading range of advanced digital motion controllers The XJTAG system is being used by engineers at Etel's 12,000m2 engineering and manufacturing centre in Motiers, Switzerland, to improve and speed up the process of debugging and testing its PCBs, which contain multiple ball grid array (BGA) devices
This article was originally published on Electronicstalk on 20 Dec 2005 at 8.00am (UK)
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The XJTAG system is also being used for production testing by Etel's contract manufacturing partners.
With subsidiaries throughout Europe and North America, Etel provides advanced motion control technology to a range of industries from semiconductor and electronics manufacturing to biomedical, machine tools and precision automation.
It is the first manufacturer to offer fully digital, interpolated and distributed position control systems for multi-axis, direct drive applications.
Further reading
Boundary scan development system free for CEMs
XJTAG is offering UK-based contract electronic manufacturers a free XJRunner, the production-optimised version of its XJTAG boundary scan development system.
Development system speeds complex board debug
Prism Electronics uses the XJTAG boundary scan development system to speed up the process of debugging and testing highly complex printed circuit boards.
Boundary scan system speeds debugging
The XJTAG system has enabled ARM to achieve its ten-minutes-per-board boundary scan production test target, and to significantly improve production yields.
Christophe Meier, R and D Engineer at Etel, says: "The XJTAG system complements our already extensive range of test equipment and will ensure that our products continue to meet our own, and our customers' exacting quality standards".
"XJTAG's boundary scan system features a graphical JTAG analysis and debugging tool which enables our engineers to look beneath and verify the connections on the multiple high-pin-count BGA devices on our latest range of boards".
"This is important as these devices are typically inaccessible to traditional test methods such as flying probes, logic analysers, oscilloscopes and X-ray systems".
Joao De Oliveira, VP Business Development, XJTAG, says: "We are delighted that the XJTAG system has been selected by Etel, a market leading supplier of motion control systems and a pioneer in rotary drives and linear motors".
"XJTAG is easy-to-use, competitively priced, and boasts unparalleled speed and accuracy of fault diagnosis".
"In addition, test IP is retained because the device-centric test scripts can be ported from project to project and reused at the design and prototyping stage and through to production and beyond".
The XJTAG development system is a cost-effective "out-of-the-box" solution for debugging, testing, programming and servicing electronic printed circuit boards and systems throughout the product lifecycle.
The XJTAG system reduces the time and cost of board development and prototyping by allowing early test development, early design validation of CAD netlists, fast generation of highly functional tests and test re-use across circuits using the same devices.
XJTAG enables engineers to test a high proportion of the circuit (both boundary scan and cluster devices) including BGA and chip scale packages, such as SDRAMs, Ethernet controllers, video interfaces, Flash memories, field programmable gate arrays and microprocessors.
XJTAG also enables in-system programming of FPGAs, CPLDs (complex programmable logic devices) and Flash memories.
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