Product category:
Design and Development Software
News Release from: XJTAG | Subject: XJTAG boundary scan development system
Edited by the Electronicstalk Editorial
Team on 06 September 2007
Boundary scan system speeds debugging
The XJTAG system has enabled ARM to achieve its ten-minutes-per-board boundary scan production test target, and to significantly improve production yields.
ARM has selected the XJTAG boundary scan development system to improve and speed up the process of debugging and testing its range of ARM RealView development hardware tools, which include high-density, multi-layer development boards ARM is currently using XJTAG on its latest generation of RealView platform baseboards, which contain multiple high-pin-count ball grid array (BGA) devices, including processors, application-specific integrated circuits (ASICs), field programmable gate arrays (FPGAs) and complex programmable logic devices (CPLDs)
This article was originally published on Electronicstalk on 10 May 2006 at 8.00am (UK)
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Spencer Saunders, Engineering Manager, platforms, System Design Division, ARM, said: "With tens of thousands of pins on each board, we recognised that it would not be possible to validate these circuits in a commercially realistic timescale without the use of a boundary scan test system".
"After evaluating the different competitive options, we selected the XJTAG boundary scan system due to its power, performance, versatility and cost-effectiveness".
The XJTAG system has enabled ARM to speed up the process of debug and test, get test coverage up to the 90% mark, achieve its ten-minutes-per-board boundary scan production test target, and to significantly improve production yields.
Further reading
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Prism Electronics uses the XJTAG boundary scan development system to speed up the process of debugging and testing highly complex printed circuit boards.
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Etel uses the XJTAG boundary scan development system to debug and test complex printed circuit boards used in its market-leading range of advanced digital motion controllers.
Simon Payne, CEO at XJTAG, said: "With XJTAG, ARM engineers now have a boundary scan system that allows tests to be recorded, refined and repeatedly re-used throughout the development cycle both by its in-house team and contract manufacturing partners".
ARM's range of RealView development solutions are suitable for customers prototyping ARM processor-based products and are suitable for architecture and CPU evaluation, hardware and software development, and ASIC emulation.
XJTAG's built-in design-for-test (DFT) functionality has enabled ARM to use the boundary scan system right from the very beginning of the development process to help improve the design and reduce respins.
"XJTAG has saved ARM a great deal of time as it automatically handles any netlist changes by adapting to the new circuit connections, thereby avoiding the time-consuming process of manually picking through the netlist for errors", added Joao De Oliveira, VP of business development at XJTAG.
The XJTAG development system is a cost-effective 'out of the box' solution for debugging, testing and servicing electronic printed circuits boards and systems throughout the product lifecycle.
The XJTAG system reduces the time and cost of board development and prototyping by allowing early test development, early design validation of CAD netlists, fast generation of highly functional tests and test re-use across circuits using the same devices.
XJTAG enables engineers to test a high proportion of the circuit (both boundary scan and cluster devices) including BGA and chip scale packages, such as SDRAMs, Ethernet controllers, video interfaces, Flash memories, FPGAs and microprocessors.
XJTAG also enables in-system programming of FPGAs, CPLDs and Flash memories.
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