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ATE Systems
News Release from: XJTAG | Subject: XJTAG boundary scan development system
Edited by the Electronicstalk Editorial
Team on 11 March 2008
Development system eases PCB debugging
The XJTAG system has been used by engineers at Curtiss-Wright's video and graphics group in Letchworth, UK, to debug and test its latest range of printed circuit boards.
Curtiss-Wright Controls Embedded Computing has selected the XJTAG boundary scan development system to improve the process of debugging and testing its range of radar, video and graphics products The XJTAG system has been used by engineers at Curtiss-Wright's video and graphics group in Letchworth, UK, to debug and test its latest range of printed circuit boards
This article was originally published on Electronicstalk on 10 May 2006 at 8.00am (UK)
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These circuit boards feature an increasing number of ball grid array (BGA) devices, including high-performance field programmable gate arrays (FPGAs).
Alan McCormick, Managing Director, Curtiss-Wright's Video and Graphics Group, said: "We selected the XJTAG system due to its price, the speed and accuracy of fault diagnosis and because the re-usable device-centric test scripts can be ported from project to project and migrate through design, prototyping to production and beyond".
"Using XJTAG, we can very quickly debug and test both the boundary scan and cluster devices on our boards, many of which are inaccessible to traditional test methods such as flying probes, logic analysers, oscilloscopes and X-ray systems".
Curtiss-Wright's video and graphics group designs solutions for defence, aerospace, commercial and industrial marketplaces.
The XJTAG development system is a cost-effective solution for debugging, testing and programming electronic printed circuits boards and systems throughout the product lifecycle.
The XJTAG system reduces the time and cost of board development and prototyping by allowing early test development, early design validation of CAD netlists, fast generation of highly functional tests and test re-use across circuits using the same devices.
XJTAG enables engineers to test a high proportion of the circuit (both boundary scan and cluster devices) including BGA and chip scale packages, such as SDRAMs, Ethernet controllers, video interfaces, Flash memories, FPGAs and microprocessors.
XJTAG also enables in-system programming of FPGAs, CPLDs and Flash memories.
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