Latest news on Electronicstalk categorised by supplier
X-Tek Systems
Address:
Icknield Way
Icknield Industrial Estate
Tring
HP23 4JX
UK
Telephone: (UK) +44 1442 828700
http://www.xtekxray.com
Our RSS feed for news from X-Tek Systems
Request to receive our free email newsletter each week
Listing of all 20 news releases from X-Tek Systems:
Inspection system for computerised tomography
The X-Tek Group will announce a new camera and detector combination for the Revolution NanoTech X-ray inspection system at APEX 2007.
News from X-Tek Systems ( 6 February 2007)
Computerised tomography aids joint inspection
The X-Tek Group has added computerised tomography (CT), a powerful new 3D imaging capability, to its advanced Revolution microfocus system.
News from X-Tek Systems (25 September 2006)
Microfocus X-ray systems distributed in Italy
X-Tek Group has appointed Prodelec as its new distributor in Italy.
News from X-Tek Systems (29 May 2006)
Smith to direct operations
X-Tek Group has appointed Peter Smith as Operations Director.
News from X-Tek Systems (29 May 2006)
X-ray inspection system upgraded
X-Tek Systems will demonstrate the latest software and hardware advances to its Revolution X-ray inspection system at APEX this year.
News from X-Tek Systems (17 January 2006)
X-ray inspection shows up at Productronica
X-Tek Systems showed a range of X-ray inspection systems at Productronica.
News from X-Tek Systems (16 December 2005)
Advanced Semiconductor Engineering improves focus
Advanced Semiconductor Engineering (ASE) has ordered the first of a series of X-Tek Hawk systems.
News from X-Tek Systems (22 April 2003)
Fraunhofer buys system for advanced tomography
X-Tek Systems has sold one of its HMX ST 225 X-ray inspection systems with advanced 3D computed tomography capabilities to the Fraunhofer Institute of Manufacturing Engineering and Automation.
News from X-Tek Systems (28 March 2003)
Hursey looks to Europe
X-Tek Systems has appointed Steve Hursey to the newly created position of European Sales Manager.
News from X-Tek Systems (25 March 2003)
Software boost for X-ray inspection systems
X-Tek has today launched a range of software upgrades available across its range of world-leading real-time microfocus X-ray inspection systems.
News from X-Tek Systems (14 February 2003)
X-ray system for BAE Systems
BAE Systems Controls has ordered one of X-Tek Systems' latest generation Hawk 160 X-ray inspection systems.
News from X-Tek Systems ( 7 February 2003)
Taylor takes global responsibility
X-Tek has appointed David Taylor to the newly created position of Commercial Director with group-wide, global responsibilities.
News from X-Tek Systems (31 January 2003)
KETI is keen on X-ray inspection
KETI, the Korean Electric Testing Institute, has taken delivery of one of the first export orders for X-Tek Systems' top of the range Orbita real-time microfocus X-ray inspection systems.
News from X-Tek Systems (30 January 2003)
Aylott takes charge of UK sales
Stanley Aylott is the new UK Sales Manager at X-Tek Systems.
News from X-Tek Systems (30 December 2002)
Goddard takes charge of production
Les Goddard is the new Production Manager at X-Tek Systems.
News from X-Tek Systems (20 December 2002)
Low-cost real-time X-ray inspection at Nepcon
X-Tek Systems staged the UK launch of its advanced new Orbita X-ray system at Nepcon.
News from X-Tek Systems ( 8 October 2002)
Global role for Ramsay
X-Tek Systems has appointed Paul Ramsay to the newly created position of Sales and Marketing Manager with global responsibilities.
News from X-Tek Systems ( 2 October 2002)
Quiggin adds software focus
X-Tek Systems has appointed Niall Quiggin as Senior Software Engineer.
News from X-Tek Systems (29 August 2002)
X-ray system to make debut at Nepcon
X-Tek Systems will exhibit its advanced new Orbita X-ray system for the first time in the UK at Nepcon 2002.
News from X-Tek Systems ( 6 August 2002)
A new angle on X-ray PCB inspection
Purpose-designed for PCB inspection, the Orbita is said to be the first microfocus X-ray system capable of providing an indexing 75-degree oblique view while maintaining true geometric magnification.
News from X-Tek Systems (24 June 2002)
