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X-ray system to make debut at Nepcon

Edited by the Electronicstalk editorial team Aug 6, 2002

X-Tek Systems will exhibit its advanced new Orbita X-ray system for the first time in the UK at Nepcon 2002.

X-Tek Systems will exhibit its advanced new Orbita X-ray system for the first time in the UK at Nepcon 2002.

Purpose-designed for the inspection of large circuit boards, the Orbita is believed to be the first microfocus x-ray system capable of providing an indexing 75-degree oblique view of PCBs while maintaining a true geometric magnification.

Designed for manual and programmed inspection of large area PCBs and electronic components, the Orbita sets new standards in performance and ergonomics.

The Orbita makes it easier for operators to produce scan results previously unattainable from X-ray systems.

Ideal for inspecting BGA ball wetting, ball to pad delaminations, cracked BGA joints and lifted bond wires, the revolutionary new Orbita achieves oblique angles of up to 75 degrees by coupling the X-ray source and imaging intensifier on a single axis.

Replacing a traditional tilt axis in this way ensures that the image remains in the centre of the region of interest at all angles of tilt.

For quick and effective scanning of single or multiple BGA balls, the Orbita's true concentric imaging operates over the entire scan area of the manipulator with the region of interest remaining locked regardless of a sample's position on the manipulator.