Product category:
Stand-Alone Instruments
News Release from: X-Tek Systems
Edited by the Electronicstalk Editorial
Team on 07 February 2003
X-ray system for BAE Systems
BAE Systems Controls has ordered one of X-Tek Systems' latest generation Hawk 160 X-ray inspection systems.
BAE Systems Controls has ordered one of X-Tek Systems' latest generation Hawk 160 X-ray inspection systems Widely used for the inspection PCBs throughout the electronics industry, the new Hawk X-ray inspection system will be used at BAE Systems, Johnson City, NY, facility to inspect avionics PCBs and aircraft flight sticks
This article was originally published on Electronicstalk on 24 Jun 2002 at 8.00am (UK)
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The X-Tek Hawk combines high magnification and high resolution, with feature recognition down to one micron.
A sample scan area of up to 14 x 21in enables it to accommodate large single samples or trays of components.
It offers geometric magnification 2400x and system magnification of up to 6000x.
According to Nick Hadland, Director of X-Tek: "The Hawk X-ray system is a breakthrough for real-time X-ray inspection in the US avionics market.
The speed, ease of use and flexibility of this advanced real-time X-ray inspection system offers a major leap forward in the non-destructive testing of avionics components.
X-Tek's world-leading technology in this area will see us providing a growing number of this type of system to the avionics industry both in the US and globally".
X-Tek's unique patented integral X-ray guns, featured in the Hawk, combine a high voltage generator and 160kV demountable X-ray tube, resulting in a large reduction in size, weight and maintenance.
The system features a robust five-axis variable-speed programmable sample manipulator controlled manually by noncontact joysticks, or by using the X-Tek's proprietary iXS image processing and control package.
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