Fraunhofer buys system for advanced tomography

X-Tek Systems has sold one of its HMX ST 225 X-ray inspection systems with advanced 3D computed tomography capabilities to the Fraunhofer Institute of Manufacturing Engineering and Automation.

X-Tek Systems has supplied one of its latest HMX ST 225 X-ray inspection systems with advanced 3D computed tomography (CT) capabilities to the Fraunhofer Institute of Manufacturing Engineering and Automation (IPA) in Stuttgart.

Germany's leading organisation of applied research for a wide range of nondestructive testing (NDT) applications, Fraunhofer IPA serves the test and inspection needs of diverse industries from electronics and telecomms through to automotive and power tools.

Among its extensive list of clients are DaimlerChrysler, Volkswagen, Porsche, Fiat, Siemens and Bosch.

The purchase of X-Tek's HMX ST real-time microfocus X-ray inspection system along with X-Tek's proprietary computed tomography software will allow Fraunhofer IPA to successfully test and generate complex 3D images of microscopic electronic components as well complete assemblies, PCBs and even complete devices such as mobile phones.

It will also be used to nondestructively test a wide range of high-density metals and low-density plastics, ceramics, glass-fibre and other composites.

Explaining on the decision to choose the X-Tek machine, Nico Blessing, Project Manager, Information Processing at Fraunhofer IPA said: "X-Tek's major strength lies in the smooth integration between software and hardware that its systems provide.

This enables us to integrate our own software modules into the HMX ST system, and access and manipulate CT data sets very quickly and easily".

Further factors in the choice of the HMX ST were its powerful 225kV powerful X-ray source and extremely fine microfocal X-ray spot size of just 5um, which together will allow Fraunhofer IPA to gain exceptional image resolution and system magnification up to 400x.

Back to top