Product category:
Stand-Alone Instruments
News Release from: X-Tek Systems
Edited by the Electronicstalk Editorial
Team on 16 December 2005
X-ray inspection shows up at
Productronica
X-Tek Systems showed a range of X-ray inspection systems at Productronica.
X-Tek Systems showed a range of X-ray inspection systems at Productronica As well as the Compact system, the new Revolution, launched earlier this year, was on display
This article was originally published on Electronicstalk on 24 Jun 2002 at 8.00am (UK)
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A new angle on X-ray PCB inspection
Purpose-designed for PCB inspection, the Orbita is said to be the first microfocus X-ray system capable of providing an indexing 75-degree oblique view while maintaining true geometric magnification.
The Revolution offers a viewing angle of up to 75 degrees, just 15 degrees to the plane of the board - a greater degree of inspection than any comparable system.
This allows for maximum magnification (up to 6000x) at all angles over the entire 410 x 410mm manipulator scan area, for 100% BGA, micro-BGA, multilayer board and PCB solder joint inspection, with quick analysis of BGA ball wetting, attachment, cracks and delaminations.
Feature recognition is in the nanometre range thanks to the Nanotech source.
The Revolution features X-Tek's unique 160XI cable-free open X-ray tube.
This offers true Nanotech resolution in an extremely stable and low-maintenance format, with quick-change super life filaments.
The superior positional accuracy is achieved through advanced encoded motors on all axes, to give precise feedback for high-speed and accurate inspection.
For ease of use, the system introduces the new user-friendly InspectX software and is ergonomically designed for operating comfort, with both mouse and joystick control and an easy-access sample loading door.
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