Product category:
Test Accessories
News Release from: Yokogawa Europe - Test and Measurement | Subject: 700937 oscilloscope probe
Edited by the Electronicstalk Editorial
Team on 02 September 2002
High-frequency current probe
A new oscilloscope probe provides high-performance current measurements in high-frequency switching systems typically used in power electronics applications.
Now available from Yokogawa Martron, the 700937 oscilloscope probe is a high-performance device designed for current measurements in high-frequency switching systems typically used in power electronics applications The use of a noninvasive clamp technique means that the circuit under investigation does not have to be broken in order to carry out current measurements
This article was originally published on Electronicstalk on 26 Jan 2001 at 8.00am (UK)
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The 50MHz bandwidth probe will measure currents up to 15A (DC + AC peak) for continuous operation, 30A peak for intermittent operation, and up to 50A peak for pulses of 10us duration or less.
The probe can be directly connected to an oscilloscope with a 1Mohm input impedance, and can be supplied with an optional power supply or powered from the standard power output provided on Yokogawa oscilloscopes.
When combined with voltage measurements on the second channel of the oscilloscope, the resulting two readings can be combined using mathematical functions to create a third trace representing instantaneous power.
Amplitude accuracy is 0.5% of reading, and rise time is 7ns.
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