Product category:
Opto and Fibre Test Equipment
News Release from: Yokogawa Europe - Test and Measurement | Subject: AQ2200-641
Edited by the Electronicstalk Editorial
Team on 20 September 2007
Optical instrumentation extends to XFP
modules
Optical instrumentation system can now test 10Gbit/s small-form-factor pluggable modules.
Yokogawa has added an XFP interface to its AQ2200 Series modular optical instrumentation system, allowing it to test 10Gbit/s small-form-factor pluggable modules The new AQ2200-641 expands the flexibility of Yokogawa's existing 10Gbit/s BERT (bit error rate tester), which integrates a pulse pattern generator, an error detector and a signal generator - all the essential elements in bit-error-rate measurements - in a compact module
This article was originally published on Electronicstalk on 24 Aug 2007 at 8.00am (UK)
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The AQ2200-641 expands the flexibility of the AQ200 series multi-application test system and reduces the total measurement time for both active and passive multiport component tests.
Versatile tester for IEEE-1394 bus
The new FireWorks 1394 VK9000 from Yokogawa Martron is designed to provide engineers with a powerful 'out of the box' solution for testing systems based on the IEEE-1394 bus.
When combined with the new AQ2200-641 XFP interface module and an XFP module, the BERT tester provides all the facilities required for error-rate curve measurements and optical device characterisation.
Thanks to the new module and the availability of XFP devices at various wavelengths, Yokogawa is now able to support 850nm multimode 10Gbit/s measurements as well as the other standard wavelengths normally used for single-mode fibre applications.
The pulse pattern generator function in the new module can generate patterns of up to 256bit in length (optionally extendable to 64Mbit), including pseudorandom binary signals (PRBS) from PRBS7 to PRBS31, with support for multiple bit rates from 9.95 to 11.32Gbit/s, variable in steps of 1kHz.
Further reading
Bluetooth analysis via the USB
At the Embedded Systems Show Yokogawa Martron is introducing a new Bluetooth analyser to complement its range of test and measurement tools for communications and bus protocol analysis.
Four-channel digital scope sends its own e-mails
The Yokogawa DL1740 SignalExplorer is a compact 4-channel digital oscilloscope that combines a sampling rate of 1Gsample/s, an analogue bandwidth of 500MHz and a memory length of 1Mword.
A 64Mbit option supports SDH/Sonet frame programming.
Other adjustable parameters include output amplitude (0.5 to 2.0V peak-to-peak in steps of 10mV), offset (-2.0 to +3V in steps of 10mV), and crosspoint (30 to 70% in steps of 1%).
A trigger output is provided for oscilloscope synchronisation, as well as a port for external 10Gbit/s clock synchronisation input and 1/16 or 1/64 synchronisation input.
This makes it possible to perform an error rate test with jitter deliberately added to the data pattern.
A clock and data recovery (CDR) function extracts the clock from the data signal and performs synchronisation when a data signal is the only input.
In optical communications, the CDR function is a useful tool because the data signal is often transmitted alone.
In addition to the CDR input port, there are ports for separate data and clock signal inputs.
The AQ2200-601 can be used with Yokogawa's AQ2202 nine-slot mainframe to form a complete compact, lightweight optical measurement system that optimises the use of laboratory bench space and is easily portable.
For situations where only electrical BERT measurements required, an alternative solution is provided by the AQ2200-601 module in conjunction with the AQ2201 three-slot mainframe.
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