Product category:
Stand-Alone Instruments
News Release from: Yokogawa Europe - Test and Measurement | Subject: GS820
Edited by the Electronicstalk Editorial
Team on 04 October 2007
Programmable source aids device
characterisation
DC voltage and current generator for high-speed and highly accurate measurement of the voltage, current and other characteristics of semiconductor devices and other electronic equipment.
The new Yokogawa GS820 multichannel source/measure unit is a programmable DC voltage and current generator that is capable of high-speed and highly accurate measurement of the voltage, current and other characteristics of semiconductor devices and other electronic equipment The GS820 features the industry's fastest testing speeds, with a typical measurement time of 1ms, and is capable of highly accurate (0.02%) voltage and current generation
This article was originally published on Electronicstalk on 26 Jan 2001 at 8.00am (UK)
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The GS820 can simultaneously generate and measure two different types of signal.
Since up to four units can be connected to one master unit, it is possible to expand the input/output capacity to a maximum of 10 channels, making it possible for the GS820 to simultaneously measure many functions of multiterminal and multifunctional semiconductor devices.
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Parameters such as signal output switchover, signal output range switchover, and measurement data acquisition times can each be measured in approximately 1ms, the fastest in the industry.
This means that the GS820 can significantly reduce the amount of time needed to perform each measurement in both product development and production-line applications, with resultant savings in both time to market and production costs.
The new product is targeted at testing the latest generation of multifunction large-scale integrated circuits for portable electronic equipment in the mobile communications and consumer electronics sectors.
Until now, anyone needing a two channel device with digital input/output, (0.02% accuracy voltage/current generation and measurement, and the capability of easily building a test environment had no choice other than to use an expensive multifunctional semiconductor parameter analyser.
As the GS820 focuses on the minimum necessary voltage and current generation/measurement functions, it has been possible to achieve improvements in operability while keeping the unit price down.
The GS820 also addresses the industry trend towards achieving high functionality and reducing power consumption through mixed-signal analogue/digital signal conversion and processing devices.
A single GS820 unit can measure semiconductor devices that have both analogue and digital signal processing circuits.
Two models of the GS820 are being released: a standard model and a digital signal input/output model.
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